Keysight Technologies Inc. has announced the design and test solution for double data rate 6 (LPDDR6) with low performance, a complete design and test solution to support the next technology wave for storage systems. The solution significantly improves the device and system validation and offers new test automation tools for tests required for the further development of AI, especially in mobile and edge devices.
The memory market is developing due to the increasing demand for high-performance computing, AI and energy-efficient mobile applications. LPDDR6 significantly improves performance and efficiency to support the next generation calculation system requirements, which makes it a decisive upgrade for modern devices. The test complexity has grown with the introduction of next generation storage devices such as LPDDR6, HBM4 and GDDR7. These technologies require advanced test methods to ensure reliability and performance, and the reduction in test times and maintaining accuracy is a constant challenge.
The full workflow solution from Keysight consists of transmitter and recipient test applications and the ADS -Speicher -Workflow solution for Advanced Design System (ADS). The LPDDR6 test solution can be paired with the Keysight EDA software and the Keysight Memory Designer bundle to achieve a faster denomination of simulation to checking and testing. The LPDDDDR6 testing solution solution is based on the Keysight and high-performance M8040A-bit error ratio.
The effects of LPDDR6 are expected to go beyond mobile devices. The combination of high performance and performance efficiency by the new memory standard is particularly suitable for AI and machine learning applications, high-speed digital computing, automotive systems, data centers and other edge applications.
Important advantages of the LPDDR6 test solution from Keysight:
Accelerate the time to market with advanced broadcast tests
- Reduce the validation time with fully automated compliance tests and characterization.
- Fast precisely measurements with the industry leading technology with a low rank.
- Debugg design problems faster with optimized data analysis tools.
- Analyze the devices with extrapolated eye mask rim tests.
- Get precise signal measurements directly from BGA packages with special DEEMBEDING functions.
Optimize the device performance with comprehensive recipient tests
- Valide constructions using the proven Bit error -ratio test method.
- Submit the performance problems early by testing several jitter, transfer and intoxication scenarios.
- Maximize the signal integrity through detailed over -analysis and recipient compensation optimization.
- Make a high level of interoperability in the validation of device and host controllers.
Deliver the next generation storage solutions
- Activate faster user experiences with higher data installment support.
- Expand the battery life and reduce electricity consumption in mobile and data center applications.
- Create more reliable products with improved functions for data integrity and system stability.